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Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures
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Authors
Crupi, F.
;
Giusi, G.
;
Iannacone, G.
;
Magnone, P.
;
Pace, C.
;
Simoen, Eddy
;
Claeys, Cor
ISSN
0021-8979
Issue
7
Journal
Journal of Applied Physics
Volume
106
Title
Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures
Publication type
Journal article
Embargo date
9999-12-31
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