A model for MOS gate stack quality evaluation based on the gate current 1/f noise

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Authors
Magnone, P.; Crupi, F.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor
Conference
9th European Workshop on Ultimate Integration of Silicon - ULIS
Title
A model for MOS gate stack quality evaluation based on the gate current 1/f noise
Publication type
Proceedings paper
Embargo date
9999-12-31
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