Browsing by author "Delaey, L."
Now showing items 1-15 of 15
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A novel approach to the short stripe effect in electromigration: modeling and experiment
Glickman, E.; Proost, Joris; Maex, Karen; Nathan, M.; Delaey, L. (2000) -
Compensation effect during water desorption from siloxane-based spin-on dielectric thin films
Proost, Joris; Baklanov, Mikhaïl; Maex, Karen; Delaey, L. (2000) -
Electromigration threshold in damascene versus plasma-etched interconnects
Proost, Joris; Maex, Karen; Delaey, L. (1998) -
Electromigration-induced drift in damascene and plasma-etched Al(Cu). II: Mass transport mechanisms in bamboo interconnects
Proost, Joris; Maex, Karen; Delaey, L. (2000) -
Evaluation of room temperature wafer bonding by fabrication of a GaAs/Pt/Si metal base transistor
Dessein, Kristof; Nemeth, Stefan; Vlutters, R.; Delaey, L.; De Boeck, Jo; Borghs, Gustaaf (1999) -
Evaluation of vacuum bonded GaAs/Si spin-valve transistors
Dessein, Kristof; Boeve, Hans; Kumar, P. S. A.; De Boeck, Jo; Lodder, J. C.; Delaey, L.; Borghs, Gustaaf (2000) -
Evaluation of wafer bonding technology and the GaAs/Si spin-valve transistor
Dessein, Kristof; Anil Kumar, P. S.; Lodder, J. C.; Borghs, Gustaaf; Delaey, L.; De Boeck, Jo (2000) -
GaAs/Si hybrid spin-valve transistors
Dessein, Kristof; Anil Kumar, P. S.; De Boeck, Jo; Lodder, J. C.; Delaey, L.; Borghs, Gustaaf (2000) -
GaAs/Si spin-valve transistors with improved transfer coefficient
Dessein, Kristof; De Boeck, Jo; Borghs, Gustaaf; Anil Kumar, P. S.; Delaey, L. (2000) -
Improvement of the transfer coefficient of GaAs/Si spin-valve transistors
Dessein, Kristof; Kumar, P. S. A.; Lagae, Liesbet; De Boeck, Jo; Delaey, L.; Borghs, Gustaaf (2001) -
Plasticity of electromigration-induced hillocking and how it affects the critical length
Proost, Joris; Maex, Karen; Delaey, L. (2001) -
Plasticity of electromigration-induced hillocking and its effect on the critical length
Proost, Joris; Delaey, L.; D'Haen, Jan; Maex, Karen (2002) -
The role of grain boundary structure on electromigration-induced drift in pure Al and Al(0.5wt% Cu)
Proost, Joris; Samajdar, I.; Verlinden, B.; Van Houtte, P.; Maex, Karen; Delaey, L. (1998) -
The vacuum wafer bonding technique as an alternative method for the fabrication of metal/semiconductor heterostructures
Dessein, Kristof; Anil Kumar, P. S.; Nemeth, Stefan; Delaey, L.; Borghs, Gustaaf; De Boeck, Jo (2000) -
The vacuum wafer bonding technique as an alternative method for the fabrication of metal/semiconductor heterostructures
Dessein, Kristof; Kumar, P. S. A.; Nemeth, Stefan; Delaey, L.; Borghs, Gustaaf; De Boeck, Jo (2001)