Browsing by author "Pogany, D."
Now showing items 1-5 of 5
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HBM ESD robustness of GaN-on-Si Schottky diodes
Chen, Shih-Hung; Griffoni, Alessio; Srivastava, Puneet; Linten, Dimitri; Thijs, Steven; Scholz, Mirko; Marcon, Denis; Gallerano, A.; Lafonteese, D.; Concannon, A.; Vashchenko, V.A.; Hopper, P.; Bychikhin, S.; Pogany, D.; Van Hove, Marleen; Decoutere, Stefaan; Groeseneken, Guido (2012) -
IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors
Marko, P.; Meneghini, M.; Bychikhin, S.; Marcon, Denis; Meneghesso, G.; Zanoni, E.; Pogany, D. (2012) -
Optical testing of submicron-technology MOSFETs and bipolar transistors
Pogany, D.; Fürböck, C.; Seliger, N.; Habas, Predrag; Gornik, E.; Kubicek, Stefan; Decoutere, Stefaan (1997) -
Test circuits for fast and reliable assessment if CDM robustness of I/O stages
Stadler, W.; Esmark, K.; Reynders, K.; Zubeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, D.; Mettler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Groeseneken, Guido; Morena, E.; Stella, I.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M. (2005) -
Test circuits for fast and reliable assessment of CDM robustness of I/O stages
Stadler, Wolfgang; Esmark, K.; Reynders, K.; Zuhbeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, S.; Settler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Groeseneken, Guido; Morena, E.; Stella, R.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M. (2003)