Browsing by author "Criel, Steven"
Now showing items 1-16 of 16
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Accurate characterization of some radiative EMC phenomena at chip level, using dedicated EMC-testchips
Criel, Steven; Bonjean, F.; De Smedt, R.; De Moerloose, Jan; Martens, Luc; Olyslager, Frank; De Zutter, Daniel (1998) -
Accurate finite difference time domain (FD-TD) analysis of arbitrary coaxial shields using the triaxial-cell characterization procedure
Criel, Steven; Martens, Luc; De Zutter, Daniel (1995) -
Approximate simulation of the shielding effectiveness of a rectangular enclosure with a grid wall
De Smedt, R.; De Moerloose, Jan; Criel, Steven; De Zutter, Daniel; Olyslager, Frank; Laermans, Eric; Wallyn, W.; Lietaert, N. (1998) -
Assessment of the shielding effectiveness of a real enclosure
De Smedt, R.; De Moerloose, Jan; Criel, Steven; De Zutter, Daniel; Olyslager, Frank; Laermans, Eric; Wallyn, W.; Lietaert, N. (1998) -
Comparison of FDTD and MoM for shielding effectiveness modelling of test enclosures
De Moerloose, Jan; Criel, Steven; De Smedt, R.; Laermans, Eric; Olyslager, Frank; De Zutter, Daniel (1997) -
EMC-Modelling and Characterisation of Coaxial Shieldings and of the Radiation of PCB's
Criel, Steven (1995-11) -
Evaluation of a New Measurement Set-up for the Accurate Characterisation of the Near-Field Radiated Emission of Printed Circuit Boards
Criel, Steven; Martens, Luc; De Zutter, Daniel (1994) -
Mixed assembly of PCB using a novel flip-chip technology
Vanfleteren, Jan; Stoukatch, Serguei; Vandecasteele, Bjorn; Van Calster, Andre; Criel, Steven; Willems, Geert; De Langhe, Pascal; Vandamme, Lorenz; Allaert, K. (2000) -
Mixed assembly on PCB using a novel flip-chip technology
Vanfleteren, Jan; Stoukatch, Serguei; Vandecasteele, Bjorn; Van Calster, Andre; Criel, Steven; Willems, Geert; De Langhe, Pascal; Vandam, L.; Allaert, K. (2000) -
Near- and Far-Field Characterization of Perforated Screens: Theoretical and Experimental Study of Proposed Definitions for the Shielding Performance
Criel, Steven; Martens, Luc; De Zutter, Daniel (1994) -
Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems
Haelvoet, Kurt; Criel, Steven; Dobbelaere, Franky; Martens, Luc; De Langhe, Pascal; De Smedt, R. (1996) -
Numerical and experimental study of the shielding effectiveness of a metallic enclosure
Olyslager, Frank; Laermans, Eric; De Zutter, Daniel; Criel, Steven; De Smedt, R.; Lietaert, N.; De Clercq, A. (1999) -
Simulations of small apertures and grids by the FDTD method
De Moerloose, Jan; De Smedt, R.; Criel, Steven; De Zutter, Daniel (1998) -
Theoretical and experimental determination of the shielding effectiveness of test enclosures
Criel, Steven; De Smedt, R.; Laermans, Eric; Olyslager, Frank; De Zutter, Daniel; Lietaert, N.; De Clerq, A. (1997) -
Theoretical and experimental near-field characterization of perforated shields
Criel, Steven; Martens, Luc; De Zutter, Daniel (1994) -
Theoretical and experimental quantitative characterization of the near-fields of printed circuit board interconnection structures
Criel, Steven; Haelvoet, Kurt; Martens, Luc; De Zutter, Daniel; Franchois, Ann; De Smedt, R.; De Langhe, Pascal (1995)