Browsing by author "Niedermann, P."
Now showing items 1-8 of 8
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Characterization of conductive probes for atomic force microscopy
Trenkler, Thomas; Hantschel, Thomas; Vandervorst, Wilfried; Hellemans, L.; Kulisch, W.; Oesterschulze, E.; Niedermann, P.; Sulzbach, T. (1999) -
Cross-sectional nano-spreading resistance profiling
De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L.; Niedermann, P.; Hänni, W. (1998) -
Cross-sectional nano-srp dopant profiling
De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L.; Niedermann, P.; Hanni, W. (1997) -
Evaluating probes for "electrical" atomic force microscopy
Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert; De Wolf, Peter; Hellemans, L.; Vandervorst, Wilfried; Malavé, A.; Büchel, D.; Oesterschulze, E.; Kulisch, W.; Niedermann, P.; Sulzbach, T.; Ohlsson, O. (1999) -
Evaluating probes for "electrical" atomic force microscopy
Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert; De Wolf, Peter; Vandervorst, Wilfried; Hellemans, L.; Malavé, A.; Büchel, D.; Oesterschulze, E.; Kulisch, W.; Niedermann, P.; Sulzbach, T.; Ohlsson, O. (2000) -
Highly conductive diamond probes for scanning spreading resistance microscopy
Hantschel, Thomas; Niedermann, P.; Trenkler, Thomas; Vandervorst, Wilfried (2000) -
Integrating diamond pyramids into metal cantilevers and using them as electrical AFM probes
Hantschel, Thomas; Slesazeck, Stefan; Niedermann, P.; Eyben, Pierre; Vandervorst, Wilfried (2001) -
Mounting of moulded AFM probes by soldering
Hantschel, Thomas; Pape, U.; Slesazeck, Stefan; Niedermann, P.; Vandervorst, Wilfried (2000)