Browsing by author "Van Aert, S."
Now showing items 1-5 of 5
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Atom column detection from simultaneously acquired ABF and ADF STEM images
Fatermans, J.; den Dekker, A. J.; Mueller-Caspary, K.; Gauquelin, N.; Verbeeck, J.; Van Aert, S. (2020) -
Atom column detection from STEM images using the maximum a posteriori probability rule
Fatermans, J.; den Dekker, A.J.; O'Leary, C.M.; Nellist, P.D.; Van Aert, S. (2019) -
Atom-counting in High Resolution Electron Microscopy: TEM or STEM – That's the question
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, Jan; Van Aert, S. (2017-03) -
Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection
Fatermans, J.; den Dekker, Arnold Jan; Müller-Caspary, K.; Lobato, I.; Van Aert, S. (2018) -
Coupling Charge and Topological Reconstructions at Polar Oxide Interfaces
van Thiel, T. C.; Brzezicki, W.; Autieri, C.; Hortensius, J. R.; Afanasiev, D.; Gauquelin, N.; Jannis, D.; Janssen, N.; Groenendijk, D. J.; Fatermans, J.; Van Aert, S.; Verbeeck, J.; Cuoco, M.; Caviglia, A. D. (2021)