Browsing by author "Boschke, Roman"
Now showing items 1-20 of 26
-
Bidirectional NPN ESD protection in silicon photonics technology
Boschke, Roman; Chen, Shih-Hung; Hellings, Geert; Scholz, Mirko; De Heyn, Vincent; Verheyen, Peter; Van Campenhout, Joris; Linten, Dimitri; Thean, Aaron; Groeseneken, Guido (2016) -
Challenges for ESD solutions in germanium-based technologies
Boschke, Roman; Hellings, Geert; Chen, Shih-Hung; Scholz, Mirko; Linten, Dimitri; Groeseneken, Guido; Thean, Aaron (2016) -
Concise analytical expression for Wunsch-Bell 1-D pulsed heating and applications in ESD using TLP
Hellings, Geert; Roussel, Philippe; Wang, Nian; Boschke, Roman; Chen, Shih-Hung; Simicic, Marko; Scholz, Mirko; Steudel, Soeren; Myny, Kris; Linten, Dimitri; Hellings, Paul; Ashif, Nowab (2019) -
Defect characterization after ESD stress: merging TLP and Pulsed-IV techniques
Linten, Dimitri; Ji, Zhigang; Boschke, Roman; Hellings, Geert; Chen, Shih-Hung; Scholz, Mirko; Alian, AliReza; Collaert, Nadine; Thean, Aaron (2015) -
Demonstration of sufficient BTI reliability for a 14-nm FinFET 1.8V I/O technology featuring a thick ALD SiO2 IL and Ge p-channel
Hellings, Geert; Subirats, Alexandre; Franco, Jacopo; Schram, Tom; Ragnarsson, Lars-Ake; Witters, Liesbeth; Roussel, Philippe; Linten, Dimitri; Horiguchi, Naoto; Boschke, Roman (2017) -
ESD ballasting of Ge Finfet ggNMOS devices
Boschke, Roman; Chen, Shih-Hung; Scholz, Mirko; Hellings, Geert; Linten, Dimitri; Witters, Liesbeth; Collaert, Nadine; Groeseneken, Guido (2017) -
ESD Challenges in sub-10nm CMOS technologies
Chen, Shih-Hung; Linten, Dimitri; Scholz, Mirko; Hellings, Geert; Boschke, Roman; Horiguchi, Naoto (2016) -
ESD characterization of a-IGZO TFTs on Si and foil substrates
Wang, Nian; Chen, Shih-Hung; Hellings, Geert; Myny, Kris; Steudel, Soeren; Scholz, Mirko; Boschke, Roman; Linten, Dimitri; Groeseneken, Guido (2017) -
ESD characterization of gate-all-around (GAA) Si nanowire devices
Chen, Shih-Hung; Hellings, Geert; Linten, Dimitri; Veloso, Anabela; Scholz, Mirko; Boschke, Roman; Groeseneken, Guido; Thean, Aaron (2015) -
ESD characterization of germanium ESD devices
Boschke, Roman; Linten, Dimitri; Hellings, Geert; Chen, Shih-Hung; Scholz, Mirko; Mitard, Jerome; Mertens, Hans; Witters, Liesbeth; Van Campenhout, Joris; Verheyen, Peter; Pogany, Dionyz; Groeseneken, Guido (2014-09) -
ESD characterization of germanium FinFET diodes and ggMOS
Boschke, Roman; Linten, Dimitri; Chen, Shih-Hung; Scholz, Mirko; Hellings, Geert; Mitard, Jerome; Witters, Liesbeth; Groeseneken, Guido (2015) -
ESD characterization of planar InGaAs devices
Ji, Zhigang; Linten, Dimitri; Boschke, Roman; Hellings, Geert; Chen, Shih-Hung; Alian, AliReza; Zhou, Daisy; Mols, Yves; Ivanov, Tsvetan; Franco, Jacopo; Kaczer, Ben; Zhang, X.; Gao, R.; Zhang, J.F.; Zhang, W.; Collaert, Nadine; Groeseneken, Guido (2015) -
ESD diodes in Bulk Si gate-all-around vertically stacked horizontal nanowire technology
Chen, Shih-Hung; Hellings, Geert; Scholz, Mirko; Linten, Dimitri; Mertens, Hans; Ritzenthaler, Romain; Boschke, Roman; Groeseneken, Guido; Horiguchi, Naoto (2016) -
ESD protection design in a-IGZO TFT technologies
Scholz, Mirko; Steudel, Soeren; Myny, Kris; Chen, Shih-Hung; Boschke, Roman; Hellings, Geert; Linten, Dimitri (2016-09) -
ESD protection diodes in optical interposer technology
Boschke, Roman; Groeseneken, Guido; Scholz, Mirko; Chen, Shih-Hung; Hellings, Geert; Verheyen, Peter; Linten, Dimitri (2015) -
Gated and STI defined ESD diodes in advanced bulk FinFET technologies
Chen, Shih-Hung; Linten, Dimitri; Lee, J.-W.; Scholz, Mirko; Hellings, Geert; Sibaja-Hernandez, Arturo; Boschke, Roman; Song, M.-H.; See, Y.; Groeseneken, Guido; Thean, Aaron (2014) -
Impact of local interconnects on ESD design
Scholz, Mirko; Chen, Shih-Hung; Hellings, Geert; Linten, Dimitri; Boschke, Roman (2015-06) -
Impacts of process options on ESD device characteristics in sub-20nm bulk FinFET technology nodes
Chen, Shih-Hung; Lee, Jam-Wem; Linten, Dimitri; Scholz, Mirko; Song, Ming-Hsiang; Hellings, Geert; Boschke, Roman; Sibaja-Hernandez, Arturo; Groeseneken, Guido (2014-12) -
Improvement on CDM ESD robustness of high-voltage tolerant nLDMOS SCR devices by using differential doped gate
Chen, Shih-Hung; Linten, Dimitri; Scholz, Mirko; Hellings, Geert; Boschke, Roman; Groeseneken, Guido; Huang, S.-H.; Ker, M.-D. (2014) -
Latchup in bulk finFET technology
Dai, Chia Tsen; Chen, Shih-Hung; Linten, Dimitri; Scholz, Mirko; Hellings, Geert; Boschke, Roman; Karp, J.; Hart, M.; Groeseneken, Guido; Ker, Ming-Dou; Mocuta, Anda; Horiguchi, Naoto (2017)