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Improvement on CDM ESD robustness of high-voltage tolerant nLDMOS SCR devices by using differential doped gate
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Authors
Chen, Shih-Hung
;
Linten, Dimitri
;
Scholz, Mirko
;
Hellings, Geert
;
Boschke, Roman
;
Groeseneken, Guido
;
Huang, S.-H.
;
Ker, M.-D.
Conference
IEEE International Reliability Physics Symposium - IRPS
Title
Improvement on CDM ESD robustness of high-voltage tolerant nLDMOS SCR devices by using differential doped gate
Publication type
Proceedings paper
Embargo date
9999-12-31
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