Browsing by author "Bazley, D. J."
Now showing items 1-4 of 4
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A simulation evaluation of 100 nm CMOS device performance
Jones, S. K.; Bazley, D. J.; Augendre, Emmanuel; Badenes, Gonçal; De Keersgieter, An; Skotnicki, T. (2001) -
Active area oxidation during the densification of shallow trench isolation for sub-0.25 micron CMOS
Bazley, D. J.; Jones, S. K.; Badenes, Gonçal (1998) -
Characterisation of mechanical stresses of device isolation structures by micro-Raman spectroscopy and modelling
Jones, S. K.; Ahmed, M.; Bazley, D. J.; Beanland, R. J.; De Wolf, Ingrid; Hill, C.; Rothwell, W. J. (1999) -
Simulation of advanced-LOCOS capability for sub-0.25 micron CMOS isolation
Jones, S. K.; Bazley, D. J.; Beanland, R.; Badenes, Gonçal; Scaife, B. (1997)