Browsing by author "Jakschik, S."
Now showing items 1-4 of 4
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A 50nm high-k poly silicon gate stack with a buried SiGe channel
Jakschik, S.; Hoffmann, Thomas Y.; Cho, Hag-Ju; Veloso, Anabela; Loo, Roger; Hyun, S.; Sorada, H.; Inoue, A.; de Potter de ten Broeck, Muriel; Eneman, Geert; Severi, Simone; Absil, Philippe; Biesemans, Serge (2007) -
High resolution elastic recoil detection
Dollinger, G.; Bergmaier, A.; Goergens, L.; Neumaier, P.; Vandervorst, Wilfried; Jakschik, S. (2004) -
Influence of stress-induced leakage current on reliability of HfSiOx
Jakschik, S.; Kauerauf, Thomas; Degraeve, Robin; Hwang, Young Nam; Duschl, R.; Kerber, M.; Avellan, A.; Kudelka, S. (2007) -
Ni(Pt)Si thermal stability improvement by carbon implantation
Mertens, Sofie; Hoffmann, Thomas Y.; Vrancken, Christa; Jakschik, S.; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried; Absil, Philippe; Lauwers, Anne (2008)