Browsing by author "Hasebe, Takumi"
Now showing items 1-8 of 8
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Calibrated wafer-level HBM measurements for quasi-static and transient device analysis
Scholz, Mirko; Thijs, Steven; Linten, Dimitri; Tremouilles, David; Sawada, Masanori; Nakaei, T.; Hasebe, Takumi; Natarajan, M.I.; Groeseneken, Guido (2007) -
Calibration of very fast TLP transients
Linten, Dimitri; Roussel, Philippe; Scholz, Mirko; Thijs, Steven; Griffoni, Alessio; Sawada, Masanori; Hasebe, Takumi; Groeseneken, Guido (2009-09) -
ESD on-wafer characterization: Is TLP still the right measurement tool?
Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Sangameswaran, Sandeep; Sawada, Masanori; Nakaie, T.; Hasebe, Takumi; Groeseneken, Guido (2009-10) -
On-wafer human metal model measurements for system-level ESD analysis
Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Sawada, Masanori; Nakaei, T.; Hasebe, Takumi; Lafonteese, David; Vashchenko, Vladislav; Vandersteen, Gerd; Hopper, P.; Groeseneken, Guido (2009-09) -
On-wafer human metal model measurements for system-level ESD analysis on component level
Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Griffoni, Alessio; Sawada, Masanori; Nakaei, T; Hasebe, Takumi; Lafonteese, David; Vashchenko, Vladislav; Vandersteen, Gerd; Hopper, Peter; Meneghesso, Gaudenzio; Groeseneken, Guido (2009-10) -
On-wafer human metal model – system-level ESD stress on component level
Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Sawada, Masanori; Nakaei, Toshiyuki; Hasebe, Takumi; Groeseneken, Guido (2008-10) -
Self-protection capability of power arrays
Lafonteese, David; Vashchenko, Vladislav; Linten, Dimitri; Scholz, Mirko; Thijs, Steven; Sawada, Masanori; Nakaei, T; Hasebe, Takumi; Hopper, Peter; Groeseneken, Guido (2009-09) -
Voltage overshoot study in 20V DeMOS-SCR devices
Vashchenko, Vladislav; Jansen, Philippe; Scholz, Mirko; Hopper, Peter; Sawada, Masanori; Nakaei, Toshiyuki; Hasebe, Takumi; Thijs, Steven (2007-09)