Browsing by author "Kundu, Paromita"
Now showing items 1-6 of 6
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Advanced 3D characterisation of semiconductor devices: hybrid metrology correlating STEM-EDXS and atom probe tomography
Kundu, Paromita; Fleischmann, Claudia; Van Marcke, Patricia; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried; van der Heide, Paul (2018) -
Combined STEM-EDS tomography of nanowire structures
Bender, Hugo; Richard, Olivier; Kundu, Paromita; Favia, Paola; Zhong, Zhichao; Palenstijn, Willem Jan; Batenburg, Kees Joost; Wirix, Maarten; Kohr, Holger; Schoenmakers, Remco (2019) -
Combined STEM-EDS tomography of nanowire structures
Bender, Hugo; Kundu, Paromita; Richard, Olivier; Favia, Paola; Zhong, Zhichao; Batenburg, Kees Joost; Wirix, Maarten; Schoenmakers, Remco (2019) -
Efficient long-range conduction in cable bacteria through nickel protein wires
Boschker, Henricus T. S.; Cook, Perran L. M.; Polerecky, Lubos; Eachambadi, Raghavendran Thiruvallur; Lozano, Helena; Hidalgo-Martinez, Silvia; Khalenkow, Dmitry; Spampinato, Valentina; Claes, Nathalie; Kundu, Paromita; Wang, Da; Bals, Sara; Sand, Karina K.; Cavezza, Francesca; Hauffman, Tom; Bjerg, Jesper Tataru; Skirtach, Andre G.; Kochan, Kamila; McKee, Merrilyn; Wood, Bayden; Bedolla, Diana; Gianoncelli, Alessandra; Geerlings, Nicole M. J.; Van Gerven, Nani; Remaut, Han; Geelhoed, Jeanine S.; Millan-Solsona, Ruben; Fumagalli, Laura; Nielsen, Lars Peter; Franquet, Alexis; Manca, Jean V.; Gomila, Gabriel; Meysman, Filip J. R. (2021) -
TEM investigation of gate-all-around nanowire devices
Favia, Paola; Arimura, Hiroaki; Capogreco, Elena; Eneman, Geert; Mertens, Hans; Hikavyy, Andriy; Richard, Olivier; Witters, Liesbeth; Kundu, Paromita; Loo, Roger; Vancoille, Eric; Bender, Hugo (2019) -
TEM investigations of gate-all-around nanowire devices
Favia, Paola; Richard, Olivier; Eneman, Geert; Mertens, Hans; Arimura, Hiroaki; Capogreco, Elena; Hikavyy, Andriy; Witters, Liesbeth; Kundu, Paromita; Loo, Roger; Vancoille, Eric; Bender, Hugo (2019)