Browsing by author "Kiesewetter, Joerg"
Now showing items 1-14 of 14
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A full-automatic test system for characterizing wide-I/O micro-bump probe cards
Marinissen, Erik Jan; Fodor, Ferenc; De Wachter, Bart; Kiesewetter, Joerg; Hill, Eric; Smith, Ken (2017-06) -
A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards
Marinissen, Erik Jan; Fodor, Ferenc; De Wachter, Bart; Kiesewetter, Joerg; Hill, Eric; Smith, Ken (2017-09) -
Automated testing of bare die-to-die stacks
Marinissen, Erik Jan; De Wachter, Bart; Wang, Teng; Fiedler, Jens; Kiesewetter, Joerg; Stoll, Karsten (2015-05) -
Automated testing of bare die-to-die stacks
Marinissen, Erik Jan; De Wachter, Bart; Wang, Teng; Fiedler, Jens; Kiesewetter, Joerg; Stoll, Karsten (2015-10) -
Automated testing of bare die-to-die stacks
Marinissen, Erik Jan; De Wachter, Bart; Wang, Teng; Fiedler, Jens; Kiesewetter, Joerg; Stoll, Karsten (2015-07) -
Automated testing of singulated die-to-die stacks
Thiele, Frank; Marinissen, Erik Jan; De Wachter, Bart; Wang, Teng; Fiedler, Jens; Kiesewetter, Joerg; Stoll, Karsten (2015-09) -
Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface
Marinissen, Erik Jan; De Wachter, Bart; Smith, Ken; Kiesewetter, Joerg; Taouil, Mottaqiallah; Hamdioui, Said (2014-10) -
Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface
Marinissen, Erik Jan; De Wachter, Bart; Smith, Ken; Kiesewetter, Joerg; Taouil, Mottaqiallah; Hamdioui, Said (2014-10) -
Evaluation of advanced probe cards for large-array fine-pitch micro-bumps
Marinissen, Erik Jan; Fodor, Ferenc; De Wachter, Bart; Kiesewetter, Joerg; Smith, Ken; Hill, Eric (2017-11) -
Pre-Bond Testing Through Direct Probing of Large-Array Fine-Pitch Micro-Bumps
Marinissen, Erik Jan; De Wachter, Bart; Kiesewetter, Joerg; Smith, Ken (2019-03) -
Probing of large-array, fine-pitch microbumps for 3D ICs
Fodor, Ferenc; De Wachter, Bart; Marinissen, Erik Jan; Kiesewetter, Joerg; Smith, Ken (2017-05) -
Very small pitch micro bump array probing
Boehm, Gunther; Kalt, Samuel; Kiesewetter, Joerg; Klumpp, Armin; Marinissen, Erik Jan; Schaefer, Wolfgang (2013) -
Wafer probing on fine-pitch micro-bumps for 2.5D- and 3D-SICs
Thaerigen, Thomas; Kanev, Stojan; Kiesewetter, Joerg; Hanaway, Peter; Strid, Eric; Marinissen, Erik Jan; Dupas, Luc (2011-10) -
Wafer probing on fine-pitch micro-bumps for 2.5D- and 3D-SICs
Marinissen, Erik Jan; Daenen, Tom; Dupas, Luc; Van Dievel, Marc; Hanaway, Peter; Kiesewetter, Joerg; Smith, Ken; Strid, Eric; Thaerigen, Thomas (2011)