Browsing by author "Procel, Luis Miguel"
Now showing items 1-4 of 4
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A defect-centric analysis of the temperature dependence of the channel hot carrier degradation in nMOSFETs
Procel, Luis Miguel; Crupi, Felice; Lionel, Trojman; Franco, Jacopo; Kaczer, Ben (2016) -
A defect-centric perspective on channel hot carrier variability in nMOSFETs
Procel, Luis Miguel; Crupi, Felice; Franco, Jacopo; Trojman, Lionel; Kaczer, Ben; Wils, N.; Tuinhout, H. (2015) -
Defect-centric distribution of channel hot carrier degradation in nano-MOSFETs
Procel, Luis Miguel; Crupi, Felice; Franco, Jacopo; Trojman, Lionel; Kaczer, Ben (2014) -
Experimental evidence of the quantum point contact theory in the conduction mechanism of bipolar HfO2-based resistive random access memories
Procel, Luis Miguel; Trojman, Lionel; Moreno, J.; Crupi, Felice; Maccaronio, V.; Degraeve, Robin; Goux, Ludovic; Simoen, Eddy (2013)