Publication:
A defect-centric analysis of the temperature dependence of the channel hot carrier degradation in nMOSFETs
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1931 since deposited on 2021-10-23
1last month
Acq. date: 2026-01-11
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Views
1931 since deposited on 2021-10-23
1last month
Acq. date: 2026-01-11
Citations