Browsing by author "Delcorte, Arnaud"
Now showing items 1-11 of 11
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Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors
Fleischmann, Claudia; Conard, Thierry; Havelund, Rasmus; Franquet, Alexis; Poleunis, Claude; Voroshazi, Eszter; Delcorte, Arnaud; Vandervorst, Wilfried (2014) -
G-SIMS analysis of organic solar cell materials
Franquet, Alexis; Fleischmann, Claudia; Conard, Thierry; Havelund, Rasmus; Poleunis, Claude; Voroshazi, Eszter; Delcorte, Arnaud; Vandervorst, Wilfried (2013) -
G-SIMS analysis of organic solar cell materials
Franquet, Alexis; Fleischmann, Claudia; Conard, Thierry; Voroshazi, Eszter; Poleunis, Claude; Havelund, Rasmus; Delcorte, Arnaud; Vandervorst, Wilfried (2014) -
High quality profiles for inorganic material using Arn+ clusters: a must for hybrid system profiling and how to achieve them
Conard, Thierry; Fleischmann, Claudia; Havelund, Rasmus; Franquet, Alexis; Poleunis, Claude; Delcorte, Arnaud; Vandervorst, Wilfried (2015) -
Influence of the film morphology and orientation on the depth profiling of perovskite layers
Surana, Supriya; Bastos, Joao; Qiu, Weiming; Conard, Thierry; Poleunis, Claude; Delcorte, Arnaud; Vandervorst, Wilfried (2016) -
Inorganic material profiling using Arn+ cluster: Can we achieve high-quality profiles?
Conard, Thierry; Fleischmann, Claudia; Havelund, Rasmus; Franquet, Alexis; Poleunis, Claude; Delcorte, Arnaud; Vandervorst, Wilfried (2018-05) -
Large gas clusters for damageless molecular depth-profiling:
Delcorte, Arnaud; Cristaudo, Vanina; Edwards, Ryan; Pospisilova, Eva; Surana, Supriya (2016) -
Matrix effects in doped Organic Light Emitting Diode (OLED) layers
Surana, Supriya; Conard, Thierry; Cheyns, David; Delcorte, Arnaud; Vandervorst, Wilfried (2017) -
Sputtering with large On+ cluster projectiles on inorganic surfaces
Fleischmann, Claudia; Conard, Thierry; Franquet, Alexis; Niehuis, Ewald; Rading, Derk; Moellers, Rudolf; Poleunis, Claude; Delcorte, Arnaud; Vandervorst, Wilfried (2015) -
Understanding physico-chemical aspects in the depth profiling of polymer:fullerene layers
Surana, Supriya; Conard, Thierry; Fleischmann, Claudia; Tait, Jeffrey; Bastos, Joao; Voroshazi, Eszter; Havelund, Rasmus; Turbiez, Mathieu; Louette, Pierre; Felten, Alexandre; Poleunis, Claude; Delcorte, Arnaud; Vandervorst, Wilfried (2016) -
VAMAS TWA2 interlaboratory comparison: Surface analysis of TiO2 nanoparticles using ToF-SIMS
Bennet, Francesca; Opitz, Robert; Ghoreishi, Narges; Plate, Kristina; Barnes, Jean-Paul; Bellew, Allen; Belu, Anna; Ceccone, Giacomo; de Vito, Eric; Delcorte, Arnaud; Franquet, Alexis; Fumagalli, Francesco; Gilliland, Douglas; Jungnickel, Harald; Lee, Tae Geol; Poleunis, Claude; Rading, Derk; Shon, Hyun Kyong; Spampinato, Valentina; Son, Jin Gyeong; Wang, Fuyi; Wang, Yung-Chen Andrew; Zhao, Yao; Roloff, Alexander; Tentschert, Jutta; Radnik, Joerg (2023)