Browsing by author "Keppens, Bart"
Now showing items 1-9 of 9
-
A 180nm secondary electron injection flash device
Xue, Gang; Van Houdt, Jan; Haspeslagh, Luc; Wellekens, Dirk; Keppens, Bart; Maes, Herman (2001) -
Contributions to standardization of transmission line pulse testing methodology
Keppens, Bart; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Groeseneken, Guido (2001) -
Design and analysis of new protection structures for smart power technology with controlled trigger and holding voltage
De Heyn, Vincent; Groeseneken, Guido; Keppens, Bart; Natarajan, M.; Vacaresse, L.; Gallopyn, G. (2001) -
ESD reliability issues in RF CMOS circuits
Radhakrishnan, M. K.; Vassilev, Vesselin; Keppens, Bart; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Groeseneken, Guido (2002) -
Influence of device geometry on ESD performance for deep submicron CMOS technology
Bock, Karlheinz; Keppens, Bart; De Heyn, Vincent; Groeseneken, Guido; Ching, L. Y.; Naem, Abdalla (1999) -
Influence of gate length on ESD performance for deep submicron CMOS technology
Bock, Karlheinz; Keppens, Bart; De Heyn, Vincent; Groeseneken, Guido; Ching, L. Y.; Naem, Abdalla (1999) -
Influence of gate length on ESD-performance for deep submicron CMOS technology
Bock, Karlheinz; Keppens, Bart; De Heyn, Vincent; Groeseneken, Guido; Ching, L. Y.; Naem, Abdalla (2001) -
Significance of the failure criterion on transmission line pulse testing
Keppens, Bart; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Groeseneken, Guido (2002) -
Study of secondary electron injection phenomena in deep sub-micron MOSFETs and flash cells
Xue, Gang; Van Houdt, Jan; Wellekens, Dirk; Haspeslagh, Luc; Lorenzini, Martino; Keppens, Bart; Maes, Herman (2000)