Browsing by author "Iannaccone, G."
Now showing items 1-3 of 3
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Characterization of soft breakdown in thin oxide NMOSFETs based on the analysis of the substrate current
Crupi, Felice; Iannaccone, G.; Crupi, Isodiana; Degraeve, Robin; Groeseneken, Guido; Maes, Herman (2001) -
Extraction of physical parameters of alternative high-k gate stacks through comparison between measurements and quantum simulations
Campera, A.; Iannaccone, G.; Crupi, F.; Groeseneken, Guido (2005-04) -
Origin of the substrate current after soft-breakdown in thin oxide n-MOSFETs
Crupi, Felice; Iannaccone, G.; Neri, B.; Crupi, Isodiana; Degraeve, Robin; Groeseneken, Guido; Maes, Herman (1999)