Authors

Crupi, Felice; Iannaccone, G.; Crupi, Isodiana; Degraeve, Robin; Groeseneken, Guido; Maes, Herman

Issue

6

Journal

IEEE Trans. Electron Devices

Volume

48

Title

Characterization of soft breakdown in thin oxide NMOSFETs based on the analysis of the substrate current

Publication type

Journal article