Authors

Crupi, Felice; Iannaccone, G.; Neri, B.; Crupi, Isodiana; Degraeve, Robin; Groeseneken, Guido; Maes, Herman

Conference

IFPA '99 - Proceedings of the 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits;

Title

Origin of the substrate current after soft-breakdown in thin oxide n-MOSFETs

Publication type

Proceedings paper