Browsing by author "Chakrabarty, Krishnendu"
Now showing items 1-10 of 10
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Die-wrapper optimization for 3D stacked ICs
Noia, Brandon; Chakrabarty, Krishnendu; Marinissen, Erik Jan (2010) -
Optimization methods for post-bond die-internal/external testing in 3D stacked ICs
Noia, Brandon; Chakrabarty, Krishnendu; Marinissen, Erik Jan (2010-10) -
Optimization methods for post-bond testing of 3D stacked ICs
Noia, Brandon; Chakrabarty, Krishnendu; Marinissen, Erik Jan (2012-02) -
Optimization of test-access architecture and test scheduling for 3D ICs
Deutsch, Sergej; Noia, Brandon; Chakrabarty, Krishnendu; Marinissen, Erik Jan (2019-03) -
Perspectives on Emerging Computation-in-Memory Paradigms
Rai, Shubham; Liu, Mengyun; Gebregiorgis, Anteneh; Bhattacharjee, Debjyoti; Chakrabarty, Krishnendu; Hamdioui, Said; Chattopadhyay, Anupam; Trommer, Jens; Kumar, Akash (2021) -
Robust optimization of test-access architectures under realistic scenarios
Deutsch, Sergej; Chakrabarty, Krishnendu; Marinissen, Erik Jan (2015-11) -
Test-architecture optimization and test scheduling for TSV-based 3D stacked ICs
Noia, Brandon; Chakrabarty, Krishnendu; Goel, Sandeep K.; Marinissen, Erik Jan; Verbree, Jouke (2011-11) -
Test-architecture optimization for TSV-based 3D stacked ICs
Noia, Brandon; Goel, Sandeep Kumar; Chakrabarty, Krishnendu; Marinissen, Erik Jan; Verbree, Jouke (2010) -
Testing of SOCs with hierarchical cores: common fallacies, test-access optimization, and test scheduling
Goel, Sandeep K.; Marinissen, Erik Jan; Sehgal, Anuja; Chakrabarty, Krishnendu (2009) -
Uncertainty-aware robust optimization of test-access architectures for 3D stacked ICs
Deutsch, Sergej; Chakrabarty, Krishnendu; Marinissen, Erik Jan (2013-09)