Browsing by author "Mody, Jay"
Now showing items 21-40 of 45
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Experimental studies of dose retention and activation in FinFet-based structures
Mody, Jay; Duffy, Ray; Eyben, Pierre; Goossens, Jozefien; Moussa, Alain; Polspoel, Wouter; Berghmans, Bart; Van Dal, Mark; Pawlak, Bartek; Kaiser, Monja; Weemaes, Robbert; Vandervorst, Wilfried (2009) -
Impact of the environmental conditions on the electrical characteristics of scanning spreading resistance microscopy
Eyben, Pierre; Mody, Jay; Vemula, Sri Charan; Vandervorst, Wilfried (2008) -
Mapping conductance and carrier distributions in confined three-dimensional transistor structures
Schulze, Andreas; Eyben, Pierre; Mody, Jay; Paredis, Kristof; Wouters, Lennaert; Celano, Umberto; Vandervorst, Wilfried (2019) -
Modeling of doping profile in active-silicon region of silicon-on-insulator transistor as a function of channel length
Mody, Jay; Ghosh, Prasanta (2005) -
Nanoscale analysis of planar and 3D-Si-structures
Vandervorst, Wilfried; Eyben, Pierre; Polspoel, Wouter; Mody, Jay; Gilbert, Matthieu; Koelling, Sebastian (2009) -
Non-destructive characterization of activated ion-implanted doping profiles based on photomodulated optical reflectance
Bogdanowicz, Janusz; Clarysse, Trudo; Moussa, Alain; Mody, Jay; Eyben, Pierre; Vandervorst, Wilfried; Rosseel, Erik (2011) -
Non-destructive characterization of activated ion-implanted doping profiles based on photomodulated optical reflectance
Bogdanowicz, Janusz; Clarysse, Trudo; Moussa, Alain; Mody, Jay; Eyben, Pierre; Vandervorst, Wilfried; Rosseel, Erik (2010) -
Observation of diameter dependent carrier distribution in nanowire-based transistors
Schulze, Andreas; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne; Rooyackers, Rita; Vandooren, Anne; Mody, Jay; Nazir, Aftab; Leonelli, Daniele; Vandervorst, Wilfried (2011) -
Physical degradation of gate dielectrics induced by local electrical stress using conductive atomic force microscopy
Polspoel, Wouter; Favia, Paola; Mody, Jay; Bender, Hugo; Vandervorst, Wilfried (2009) -
Probing electrical properties of semiconductor structures on the nm-scale
Vandervorst, Wilfried; Meuris, Marc; De Wolf, P.; Alvarez, D.; Hantschel, Thomas; Trenkler, T.; Fouchier, M.; Duhayon, Natasja; Polspoel, Wouter; Mody, Jay (2008) -
Probing electrical properties of semiconductor structures on the nm-scale with SSRM
Vandervorst, Wilfried; Eyben, Pierre; Mody, Jay; Vanhaeren, Danielle; Schulze, Andreas (2009) -
Quantitative two-dimensional carrier mapping in silicon nanowire-based tunnel-field effect transistors with sub-3nm resolution
Schulze, Andreas; Hantschel, Thomas; Eyben, Pierre; Vandooren, Anne; Rooyackers, Rita; Mody, Jay; Verhulst, Anne; Vandervorst, Wilfried (2010) -
Scanning spreading resistance microscopy for 3D-carrier Pprofiling in FinFET-based structures
Mody, Jay; Eyben, Pierre; Polspoel, Wouter; Jurczak, Gosia; Vandervorst, Wilfried (2008) -
Scanning Spreading Resistance Microscopy for carrier profiling beyond 32nm node
Mody, Jay; Zschaetzsch, Gerd; Koelling, Sebastian; De Keersgieter, An; Eneman, Geert; Kambham, Ajay Kumar; Drijbooms, Chris; Schulze, Andreas; Chiarella, Thomas; Horiguchi, Naoto; Eyben, Pierre; Vandervorst, Wilfried (2012) -
Scanning spreading resistance microscopy for the calibration of process simulators on 65nm MOS technology.
Vemula, Sri Charan; Eyben, Pierre; De Keersgieter, An; Mody, Jay; Vandervorst, Wilfried (2007) -
Sub-nanometer characterization of nanoelectronic devices
Eyben, Pierre; Mody, Jay; Nazir, Aftab; Schulze, Andreas; Clarysse, Trudo; Hantschel, Thomas; Vandervorst, Wilfried (2013) -
Sub-nanometer two-dimensional carrier profiling in silicon MOS technologies using high vacuum scanning spreading resistance microscopy
Eyben, Pierre; Mody, Jay; Nazir, Aftab; Schulze, Andreas; Hantschel, Thomas; Vandervorst, Wilfried (2009) -
Toward extending the capabilties of scanning spreading resistance microscopy for fin field-effect-transistor-based structures
Mody, Jay; Eyben, Pierre; Augendre, Emmanuel; Richard, Olivier; Vandervorst, Wilfried (2008) -
Towards extending the capabilities of Scanning Spreading Resistance Microscopy for FinFET-based structures
Mody, Jay; Eyben, Pierre; Augendre, Emmanuel; Richard, Olivier; Arstila, Kai; Vandervorst, Wilfried (2007) -
Towards optimization of HV-SSRM for Ge and III-V carrier mapping at the nanometer scale
Eyben, Pierre; Schulze, Andreas; Clarysse, Trudo; Mody, Jay; Vandervorst, Wilfried (2009)