Browsing by author "Sawada, Ken"

A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS

Parvais, Bertrand; Wambacq, Piet; Mercha, Abdelkarim; Verkest, Diederik; Thean, Aaron; Hammo, Hiroaki; Oishi, Tetsuya; Sawada, Ken; Nomoto, Kazuki (2015)

A fully-integrated method for RTN parameter extraction

Simicic, Marko; Morrison, Sebastien; Parvais, Bertrand; Weckx, Pieter; Kaczer, Ben; Sawada, Ken; Ammo, Hiroaki; Yamakawa, Shinya; Nomoto, Kazuki; Ono, Makoto; Linten, Dimitri; Verkest, Diederik; Wambacq, Piet; Groeseneken, Guido; Gielen, Georges (2017)

Defect formation in III-V fin grown by aspect ratio trapping technique: a first-principles study

Minari, Hideki; Yoshida, Shinichi; Sawada, Ken; Nakazawa, Masashi; Pourtois, Geoffrey; Merckling, Clement; Waldron, Niamh; Guo, Weiming; Jiang, Sijia; Collaert, Nadine; Simoen, Eddy; Lin, Dennis; Caymax, Matty (2014)

Defect-based compact modeling for RTN and BTI variability

Weckx, Pieter; Simicic, Marko; Nomoto, Kazuki; Ono, Makoto; Parvais, Bertrand; Kaczer, Ben; Raghavan, Praveen; Linten, Dimitri; Sawada, Ken; Ammo, Hiroaki; Yamakawa, Shinya; Spessot, Alessio; Verkest, Diederik; Mocuta, Anda (2017)

First-principles studies of the defect formation in III-V FETs grown by aspect ratio trapping

Minari, Hideki; Yoshida, Shinichi; Sawada, Ken; Nakazawa, Masashi; Merckling, Clement; Waldron, Niamh; Guo, Weiming; Jiang, Sijia; Collaert, Nadine; Simoen, Eddy; Lin, Dennis; Caymax, Matty; Pourtois, Geoffrey (2014)

First-principles studies of the defect formation in III-V FETs grown by aspect ratio trapping

Minari, Hideki; Yoshida, Shinichi; Sawada, Ken; Nakazawa, Masashi; Caymax, Matty; Merckling, Clement; Waldron, Niamh; Guo, Weiming; Jiang, Sijia; Collaert, Nadine; Simoen, Eddy; Lin, Dennis; Pourtois, Geoffrey (2014)

In-line monitoring test structure for Charge-Based Capacitance Measurement (CBCM) with a start-stop self-pulsing circuit

Sawada, Ken; Van der Plas, Geert; Mori, Shigetaka; Cherman, Vladimir; Mercha, Abdelkarim; Verkest, Diederik; Fukuzaki, Yuzo; Ammo, Hiroaki (2015)

Pitfalls when using the SEED methodology

Scholz, Mirko; Chen, Shih-Hung; Linten, Dimitri; Thijs, Steven; Sawada, Ken; Groeseneken, Guido (2012)