Browsing by author "Tomasini, Pierre"
Now showing items 1-4 of 4
-
Impact of the pre-epi bake conditions in embedded Si1-xGex source/drain junctions
Bargallo Gonzalez, Mireia; Simoen, Eddy; Hikavyy, Andriy; Verheyen, Peter; Loo, Roger; Caymax, Matty; Machkaoutsan, Vladimir; Tomasini, Pierre; Thomas, S.G.; Wise, Rick; Claeys, Cor (2009) -
Influence of the strain-relaxation induced defect creation on the lekage current of embedded Si1-xGex source/drain junctions
Bargallo Gonzalez, Mireia; Simoen, Eddy; Vissouvanadin Soubaretty, Bertrand; Eneman, Geert; Verheyen, Peter; Loo, Roger; Claeys, Cor; Machkaoutsan, Vladimir; Tomasini, Pierre; Thomas, Shawn (2009-06) -
Stability of silicon germanium stressors
Tomasini, Pierre; Machkaoutsan, Vladimir; Thomas, Shawn; Loo, Roger; Caymax, Matty; Verheyen, Peter (2010) -
Stress analysis of Si1-xGex embedded source/drain junctions
Bargallo Gonzalez, Mireia; Simoen, Eddy; Naka, N.; Okuno, Y; Eneman, Geert; Hikavyy, Andriy; Verheyen, Peter; Loo, Roger; Claeys, Cor; Machkaoutsan, Vladimir; Tomasini, Pierre; Thomas, S.G.; Lu, J.P; Wise, Rick (2008)