Browsing by author "Duhayon, Natasja"
Now showing items 21-40 of 42
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Nanometer scale characterization of ULSI devices using scanning probes
Vandervorst, Wilfried; Eyben, Pierre; Clarysse, Trudo; Duhayon, Natasja; Xu, Mingwei; Hantschel, Thomas (2000) -
Nm-scale characterization of deep submicron devices using scanning probes
Vandervorst, Wilfried; Duhayon, Natasja; Eyben, Pierre; Xu, Mingwei; Clarysse, Trudo (2001) -
Overview of 2D profiling in Imec
Duhayon, Natasja; Eyben, Pierre; Alvarez, David; Fouchier, Marc; Blasco, X.; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (2003) -
Probing electrical properties of semiconductor structures on the nm-scale
Vandervorst, Wilfried; Meuris, Marc; De Wolf, P.; Alvarez, D.; Hantschel, Thomas; Trenkler, T.; Fouchier, M.; Duhayon, Natasja; Polspoel, Wouter; Mody, Jay (2008) -
Probing local electrical properties in semiconductors with nanometer resolution
Vandervorst, Wilfried; Duhayon, Natasja; Eyben, Pierre; Alvarez, David; Xu, Mingwei; Fouchier, Marc; Clarysse, Trudo (2003) -
Progress towards quantitative high spatial resolution 1D and 2D carrier profiling using scanning probe techniques
Duhayon, Natasja; Eyben, Pierre; Hantschel, Thomas; Xu, Mingwei; Clarysse, Trudo; Vandervorst, Wilfried (2000) -
Quantitative 2D-carrier profiling in semiconductors with sub-nm spatial resolution using SSRM
Vandervorst, Wilfried; Eyben, Pierre; Duhayon, Natasja; Alvarez, David; Fouchier, Marc; Xu, Mingwei (2003) -
Scanning spreading resistance microscopy and spectroscopy for routine and quantitative 2D-carrier profiling
Eyben, Pierre; Xu, Mingwei; Duhayon, Natasja; Clarysse, Trudo; Callewaert, Sven; Vandervorst, Wilfried (2001) -
Scanning spreading resistance microscopy and spectroscopy for routine and quantitative two-dimensional carrier profiling
Eyben, Pierre; Xu, Mingwei; Duhayon, Natasja; Clarysse, Trudo; Callewaert, Sven; Vandervorst, Wilfried (2002) -
SSRM & SCM observation of enhanced lateral AS- and BF2-diffusion induced by nitride spacers
Eyben, Pierre; Duhayon, Natasja; Stuer, Cindy; De Wolf, Ingrid; Rooyackers, Rita; Clarysse, Trudo; Vandervorst, Wilfried; Badenes, Gonçal (2001) -
SSRM & SCM observation of modified lateral diffusion of As, BF2 and Sb induced by nitride spacers
Eyben, Pierre; Duhayon, Natasja; Stuer, Cindy; De Wolf, Ingrid; Rooyackers, Rita; Clarysse, Trudo; Vandervorst, Wilfried; Badenes, Gonçal (2001) -
SSRM and SCM observation of enhanced lateral As-diffusion induced by nitride spacers
Eyben, Pierre; Duhayon, Natasja; Clarysse, Trudo; De Wolf, Ingrid; Badenes, Gonçal; Vandervorst, Wilfried (2000) -
The peel-off probe: a cost-effective probe for electrical atomic force microscopy
Hantschel, Thomas; Slesazeck, Stefan; Duhayon, Natasja; Xu, Mingwei; Vandervorst, Wilfried (2000) -
Towards routine, quantitative two-dimensional carrier profiling with Scanning Spreading Resistance Microscopy
Vandervorst, Wilfried; Eyben, Pierre; Callewaert, Sven; Hantschel, Thomas; Duhayon, Natasja; Xu, Mingwei; Trenkler, Thomas; Clarysse, Trudo (2000) -
Two dimensional carrier profiling using scanning capacitance microscopy
Duhayon, Natasja; Clarysse, Trudo; Alvarez, David; Eyben, Pierre; Fouchier, Marc; Vandervorst, Wilfried; Hellemans, L. (2003) -
Two dimensional carrier profiling with scanning capacitance microscopy
Duhayon, Natasja; Eyben, Pierre; Xu, Mingwei; Fouchier, Marc; Alvarez, David; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (2002) -
Two-dimensional carrier profiling using scanning probe microscopy
Alvarez, David; Duhayon, Natasja; Eyben, Pierre; Fouchier, Marc; Xu, Mingwei; Vandervorst, Wilfried (2002) -
Two-dimensional carrier profiling using scanning probes
Vandervorst, Wilfried; Eyben, Pierre; Duhayon, Natasja; Fouchier, Marc; Xu, Mingwei (2002) -
Two-dimensional carrier profiling with Scanning Capacitance Microscopy, industry-ready innovative research
Duhayon, Natasja; Vandervorst, Wilfried; Hellemans, L. (2003) -
Two-dimensional carrier profiling with scanning probes
Vandervorst, Wilfried; Eyben, Pierre; Alvarez, David; Duhayon, Natasja; Xu, Mingwei; Clarysse, Trudo (2002)