Browsing by author "Benedetti, Alessandro"
Now showing items 21-26 of 26
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Some observations on the corrosion of Cu after FIB preparation
Bender, Hugo; Richard, Olivier; Benedetti, Alessandro; Van Marcke, Patricia; Drijbooms, Chris (2004) -
Strain determination in silicon microstructures by combined convergent beam electron diffraction, process simulation, and micro-Raman spectroscopy
Senez, V.; Armigliato, A.; De Wolf, Ingrid; Carnevale, G.; Balboni, R.; Frabboni, S.; Benedetti, Alessandro (2003) -
TEM specimen preparation by an in-situ plucker system in a FIB
Benedetti, Alessandro; Bender, Hugo (2004-07) -
The role of preamorphization and activation for ultra shallow junction formation on strained Si layers grown on SiGe buffer
Pawlak, Bartek; Vandervorst, Wilfried; Lindsay, Richard; De Wolf, Ingrid; Roozeboom, F.; Delhougne, Romain; Benedetti, Alessandro; Loo, Roger; Caymax, Matty; Maex, Karen; Cowern, N.E.B. (2004) -
The role of preamorphization and activation for ultra shallow junction formation on strained Si layers grown on SiGe buffer
Pawlak, Bartek; Vandervorst, Wilfried; Lindsay, Richard; De Wolf, Ingrid; Roozeboom, F.; Delhougne, Romain; Benedetti, Alessandro; Loo, Roger; Caymax, Matty; Maex, Karen; Cowern, N.E.B. (2004) -
Thin film characterization of PEALD Ru layers on an ALD WNC substrate
Volders, Henny; Tokei, Zsolt; Sinapi, Fabrice; Bender, Hugo; Benedetti, Alessandro; Brijs, Bert; Conard, Thierry; Franquet, Alexis; Steenbergen, Johnny; Travaly, Youssef; Sprey, Hessel; Li, Wei-Min; Shimizu, Akira; Park, Hyung Sang (2007)