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Thin film characterization of PEALD Ru layers on an ALD WNC substrate
Publication:
Thin film characterization of PEALD Ru layers on an ALD WNC substrate
Date
2007
Proceedings Paper
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15040.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Volders, Henny
;
Tokei, Zsolt
;
Sinapi, Fabrice
;
Bender, Hugo
;
Benedetti, Alessandro
;
Brijs, Bert
;
Conard, Thierry
;
Franquet, Alexis
;
Steenbergen, Johnny
;
Travaly, Youssef
;
Sprey, Hessel
;
Li, Wei-Min
;
Shimizu, Akira
;
Park, Hyung Sang
Journal
Abstract
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1966
since deposited on 2021-10-16
443
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1966
since deposited on 2021-10-16
443
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations