Browsing by author "Vereecke, Bart"
Now showing items 21-37 of 37
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Fabrication of a CMOS-based imaging chip with monolithically integrated RGB and NIR filters
Vereecke, Bart; Van Besien, Els; Sabuncuoglu Tezcan, Deniz; Spooren, Nick; Tack, Klaas; Lambrechts, Andy (2018) -
Fabrication of a micro-lens array for Reflective Electron Beam Lithography
Vereecke, Bart; Haspeslagh, Luc; Lazzarino, Frederic; Miller, Andy; Kellens, Kristof; Dekkers, Harold; Freed, Regina; Grella, L. (2011) -
Highly Selective Color Filters Based on Hybrid Plasmonic-Dielectric Nanostructures
De Proft, Anabel; Lodewijks, Kristof; Figeys, Bruno; Kouznetsov, Dmitry; Verellen, Niels; Pham, Nga; Vereecke, Bart; Sabuncuoglu Tezcan, Deniz; Jansen, Roelof; Van Dorpe, Pol; Rottenberg, Xavier (2022) -
Improved methodology for integrated k-value extractions
Ciofi, Ivan; Borrello, Gianpaolo; Madia, Oreste; Wilson, Chris; Vereecke, Bart; Beyer, Gerald (2012) -
Integration of porogen-based low-k films: influence of capping layer thickness and long thermal anneals on low-k damage and reliability
De Roest, David; Vereecke, Bart; Huffman, Craig; Heylen, Nancy; Croes, Kristof; Arai, H; Takamure, N; Beynet, Julien; Sprey, Hessel; Matsushita, K; Kobayashi, N; Verdonck, Patrick; Demuynck, Steven; Beyer, Gerald; Tokei, Zsolt (2009) -
Integration of porogen-based low-k films: influence of capping layer thickness and long thermal anneals on low-k damage and reliability
De Roest, David; Vereecke, Bart; Huffman, Craig; Heylen, Nancy; Croes, Kristof; Arai, H.; Takamure, N.; Beynet, Julien; Sprey, Hessel; Matsushita, K.; Kobayashi, N.; Verdonck, Patrick; Demuynck, Steven; Beyer, Gerald; Tokei, Zsolt (2009) -
Investigation of wafer level packaging schemes for 3D RF interposer multi-chip module
Vereecke, Bart; Soussan, Philippe; Zhu, Jian (2017) -
Layer configurations for Al-Ge eutectic wafer bonding
Visker, Jakob; Kang, Shuo; Peng, Lan; Vereecke, Bart; Haspeslagh, Luc (2020) -
Mikrolinsen-Array fur ein vielstrahliges REBL Lithographie-Tool
Vereecke, Bart (2013) -
Mit dem Elektronenstrahl zum Mikrolinsen-Array
Vereecke, Bart (2013) -
Narrow pitch dual damascene patterning using EUV lithography in association with a spin-on trilayer resist system
Lazzarino, Frederic; Truffert, Vincent; Vereecke, Bart; Demuynck, Steven (2011) -
Quantum efficiency and dark current evaluation of a backside illuminated CMOS image sensor
Vereecke, Bart; Cavaco, Celso; De Munck, Koen; Haspeslagh, Luc; Minoglou, Kiki; Moore, George; Sabuncuoglu Tezcan, Deniz; Tack, Klaas; Wu, Bob; Osman, Haris (2015) -
Scaling of low-k dielectrics: a bumpy road
Baklanov, Mikhaïl; Zhao, Larry; Vereecke, Bart (2010) -
Screening and evaluation of different wet cleaning solution for post etch residue removal in BEOL applications
Suhard, Samuel; Claes, Martine; Loh, James; Vereecke, Guy; Pantouvaki, Marianna; Demuynck, Steven; Vereecke, Bart; Beyer, Gerald (2009) -
TEM study of carbon nanotube interconnects
Ke, Xiaoxing; Chiodarelli, Nicolo; van der Veen, Marleen; Vereecke, Bart; Hantschel, Thomas; Bals, S.; Van Tendeloo, G. (2011) -
Three-dimensional electrical profiling of carbon nanotube interconnects
Hantschel, Thomas; Schulze, Andreas; Dathe, Andre; Eyben, Pierre; van der Veen, Marleen; Vereecke, Bart; Ke, Xiaoxing; Vandervorst, Wilfried (2012) -
Wafer level electrical evaluation of vertical carbon nanotube bundles as a function of the growth temperature
Vereecke, Bart; van der Veen, Marleen; Sugiura, Masahito; Kashiwagi, Yusaku; Ke, Xiaoxing; Cott, Daire; Hantschel, Thomas; Huyghebaert, Cedric; Tokei, Zsolt (2013)