Browsing by title

E- and vE-model too conservative to describe low field time dependent dielectric breakdown

Croes, Kristof; Tokei, Zsolt (2010)

E-beam direct write using a chemically amplified negative tone resist

Seabra, Antonio C.; Jonckheere, Rik; Van den hove, Luc (1994)

E-beam mask-less lithography : prospects and challenges

Ronse, Kurt (2010)

E-beam metrology and line local critical dimension uniformity of thin dry resist films for high numerical aperture extreme ultraviolet lithography

Zidan, Mohamed; Lorusso, Gian; De Simone, Danilo; De Silva, Anuja; Haider, Ali; Verveniotis, Elisseos; Moussa, Alain; De Gendt, Stefan (2023)

e-beam metrology of thin resist for high NA EUVL

Lorusso, Gian; De Simone, Danilo; Zidan, Mohamed; Severi, Joren; Moussa, Alain; Dey, Bappaditya; Halder, Sandip; Goldenshtein, Alex; Houchens, Kevin; Santoro, Gaetano; Fischer, Daniel; Muellender, Angelika; Mack, Chris; Kondo, Tsuyoshi; Shohjoh, Tomoyasu; Ikota, Masami; Charley, Anne-Laure; De Gendt, Stefan; Leray, Philippe (2023)

E-beam metrology-based EUVL aberration monitoring

Kang, Seulki; Miura, Yuji; Maruyama, Kotaro; Yamazaki, Yuichiro; Wei, Chih-, I; Maguire, Ethan; Fenger, Germain; De Bisschop, Peter; Das, Sayantan; Halder, Sandip; Lorusso, Gian (2022)

E-beam-lithography free plasmonic slot waveguides for on-chip raman spectoscopy

Raza, Ali; Van Daele, M.; Wuytens, Pieter; Dendooven, J.; Detavernier, C.; Clemmen, Stephane; Baets, Roel (2018)

E-government and smart cities: theoretical reflections and case studies

Mechant, Peter; Walravens, Nils (2018-12)

E-health systems, components, technologies: introduction

Lauwereins, Rudy (2013)

E-learning for microelectronics manufacturing

Oechsner, Richard; Pfeffer, Marcus; Pfitzner, Lothar; Ryssel, Heiner; Beer, Kai; Boldin, Matthias; De Mey, Bart; Engelhard, Manfred; O'Murchu, Cian; Westerwick, Axel; Colson, Paul; Madore, Michael; Krahn, Ludger; Kempe, Winfried; Luisman, Ed (2004)

E-MRS spring meeting 2016 symposium AA: Solution processing and properties of functional oxide thin films and nanostructures II

Mestres, Narcis; Hardy, An; Brezesinski, Torsten; Selbach, Sverre Magnus (2017)

E-TEST validation of EPE budget and metrology

De Poortere, Etienne; Schelcher, Guillaume; Kissoon, Nicola; Paolillo, Sara; Tabery, Cyrus; Halder, Sandip; Leray, Philippe; Mulkens, Jan; McManus, Moyra (2020)

E-test validation of space error budget and metrology

Schelcher, Guillaume; De Poortere, Etienne P.; Kissoon, Nicola; Paolillo, Sara; e Silva, Marsil A. C.; Zhang, Yichen; Tabery, Cyrus; Mulkens, Jan; McManus, Moyra; Leray, Philippe; Halder, Sandip (2022-06-30)

EAGLESONG: An ARX hash with fast diffusion

Szepieniec, A.; Ashur, T. (2020)

EAM-based microwave mixer implemented in silicon photonics

Van Gasse, Kasper; Verbist, Jochem; Li, Haolin; Torfs, Guy; Bauwelinck, Johan; Roelkens, Gunther (2019)

Early assessment of emerging technologies for VLSI logic circuits from experimental measurements

Crupi, Felice; Magnone, Paolo; Alioto, Massimo; Franco, Jacopo; Groeseneken, Guido (2012)

Early defect detection for EUV self-aligned litho-etch litho-etch patterning with EPE

Anunciado, Roy; Lee, Jisun; Barzegar, Ellaheh; van der Sanden, Stefan; Schelcher, Guillaume; Schoofs, Stijn (2022)

Early differences in islets from prediabetic NOD mice : combined microarray and proteomic analysis

Crèvecoeur, Inne; Gudmundsdottir, Valborg; Vig, Saurabh; Câmara Sodré, Fernanda Marques; D'Hertog, Wannes; Fierro, Ana Carolina; Van Lommel, Leentje; Gysemans, Conny; Marchal, Kathleen; Waelkens, Etienne; Schuit, Frans; Brunak, Soren; Overbergh, Luc; Mathieu, Chantal (2017-03)

Early exploration for platform architecture instantiation with multi-mode application partitioning

Agrawal, Prashant; Raghavan, Praveen; Hartmann, Matthias; Sharma, Namita; Van der Perre, Liesbet; Catthoor, Francky (2013)

Early exploration of partitioning trade-offs for heterogeneous MPSoCs

Agrawal, Prashant; Fasthuber, Robert; Raghavan, Praveen; Vander Aa, Tom; Catthoor, Francky; Van der Perre, Liesbet (2011)