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Conference contributions
Creep as a reliability problem in MEMS
Publication:
Creep as a reliability problem in MEMS
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Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Modlinski, Robert
;
Witvrouw, Ann
;
Ratchev, Petar
;
Puers, Bob
;
Toonder, J.M.J
;
De Wolf, Ingrid
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2010
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-12
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Views
2010
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-12
Citations