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The impact of plasma-induced surface damage on photoelectrochemical properties of GaN pillars fabricated by dry etching
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The impact of plasma-induced surface damage on photoelectrochemical properties of GaN pillars fabricated by dry etching
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tseng, Peter
;
van Dorp, Dennis
;
Lieten, Ruben
;
Vereecken, Philippe
;
Langer, Robert
;
Borghs, Gustaaf
Journal
Journal of Physical Chemistry C
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1862
since deposited on 2021-10-22
Acq. date: 2025-12-12
Citations
Metrics
Views
1862
since deposited on 2021-10-22
Acq. date: 2025-12-12
Citations