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Articles
Low-cost BER tester measures errors in low-data-rate applications
Publication:
Low-cost BER tester measures errors in low-data-rate applications
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Date
2005-12
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Melange, Cedric
;
Bauwelinck, Johan
;
Pletinckx, J.
;
Vandewege, Jan
Journal
EDN
Abstract
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1909
since deposited on 2021-10-16
Acq. date: 2025-12-14
Citations
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Views
1909
since deposited on 2021-10-16
Acq. date: 2025-12-14
Citations