Publication:
Low-cost BER tester measures errors in low-data-rate applications
Date
| dc.contributor.author | Melange, Cedric | |
| dc.contributor.author | Bauwelinck, Johan | |
| dc.contributor.author | Pletinckx, J. | |
| dc.contributor.author | Vandewege, Jan | |
| dc.contributor.imecauthor | Bauwelinck, Johan | |
| dc.contributor.orcidimec | Bauwelinck, Johan::0000-0001-5254-2408 | |
| dc.date.accessioned | 2021-10-16T03:24:05Z | |
| dc.date.available | 2021-10-16T03:24:05Z | |
| dc.date.issued | 2005-12 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10879 | |
| dc.source.beginpage | 123 | |
| dc.source.endpage | 124 | |
| dc.source.issue | 25 | |
| dc.source.journal | EDN | |
| dc.source.volume | 50 | |
| dc.title | Low-cost BER tester measures errors in low-data-rate applications | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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