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Conference contributions
Quantitative 3-D model to explain large single trap charge variability in vertical NAND memory
Publication:
Quantitative 3-D model to explain large single trap charge variability in vertical NAND memory
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Date
2019
Proceedings Paper
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42821.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Verreck, Devin
;
Arreghini, Antonio
;
Bastos, Joao
;
Schanovsky, Franz
;
Mitterbauer, Ferdinand
;
Kernstock, C.
;
Karner, Markus
;
Degraeve, Robin
;
Van den Bosch, Geert
;
Furnemont, Arnaud
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1920
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Acq. date: 2025-12-10
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Metrics
Views
1920
since deposited on 2021-10-27
1
last month
Acq. date: 2025-12-10
Citations