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Atom column detection from simultaneously acquired ABF and ADF STEM images
Publication:
Atom column detection from simultaneously acquired ABF and ADF STEM images
Date
2020
Journal article
https://doi.org/10.1016/j.ultramic.2020.113046
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fatermans, J.
;
den Dekker, A. J.
;
Mueller-Caspary, K.
;
Gauquelin, N.
;
Verbeeck, J.
;
Van Aert, S.
Journal
ULTRAMICROSCOPY
Abstract
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1968
since deposited on 2021-11-02
Acq. date: 2025-10-23
Citations
Metrics
Views
1968
since deposited on 2021-11-02
Acq. date: 2025-10-23
Citations