Publication:

Atom column detection from simultaneously acquired ABF and ADF STEM images

Date

2020
Journal article
https://doi.org/10.1016/j.ultramic.2020.113046
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dc.contributor.authorFatermans, J.
dc.contributor.authorden Dekker, A. J.
dc.contributor.authorMueller-Caspary, K.
dc.contributor.authorGauquelin, N.
dc.contributor.authorVerbeeck, J.
dc.contributor.authorVan Aert, S.
dc.contributor.imecauthorFatermans, J.
dc.contributor.imecauthorden Dekker, A. J.
dc.contributor.orcidextMueller-Caspary, K.::0000-0002-2588-7993
dc.contributor.orcidextVerbeeck, J.::0000-0002-7151-8101
dc.contributor.orcidextVan Aert, S.::0000-0001-9603-8764
dc.contributor.orcidimecFatermans, J.::0000-0002-3052-4919
dc.date.accessioned2021-12-06T09:35:20Z
dc.date.available2021-11-02T16:07:08Z
dc.date.available2021-12-06T09:35:20Z
dc.date.issued2020
dc.identifier.doi10.1016/j.ultramic.2020.113046
dc.identifier.issn0304-3991
dc.identifier.pmidMEDLINE:32927326
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38336
dc.publisherELSEVIER
dc.source.beginpage113046
dc.source.issuena
dc.source.journalULTRAMICROSCOPY
dc.source.numberofpages10
dc.source.volume219
dc.subject.keywordsTRANSMISSION ELECTRON-MICROSCOPY
dc.subject.keywordsMAXIMUM-LIKELIHOOD-ESTIMATION
dc.subject.keywordsSTRUCTURE PARAMETERS
dc.subject.keywordsPHASE-CONTRAST
dc.subject.keywordsSAMPLE TILT
dc.subject.keywordsRESOLUTION
dc.subject.keywordsQUANTIFICATION
dc.subject.keywordsACCURATE
dc.title

Atom column detection from simultaneously acquired ABF and ADF STEM images

dc.typeJournal article
dspace.entity.typePublication
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