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Articles
Saturation Photo-Voltage methodology for semiconductor insulator interface trap spectroscopy
Publication:
Saturation Photo-Voltage methodology for semiconductor insulator interface trap spectroscopy
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Date
2016
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Madia, Oreste
;
Afanasiev, Valeri
;
Cott, Daire
;
Arimura, Hiroaki
;
Schulte-Braucks, C.
;
Lin, Dennis
;
Buca, D.
;
Von Den Driesch, N.
;
Nyns, Laura
;
Ivanov, Tsvetan
;
Cuypers, Dieter
;
Stesmans, Andre
Journal
ECS Journal of Solid State Science and Technology
Abstract
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1961
since deposited on 2021-10-23
Acq. date: 2025-12-10
Citations
Metrics
Views
1961
since deposited on 2021-10-23
Acq. date: 2025-12-10
Citations