Publication:

Saturation Photo-Voltage methodology for semiconductor insulator interface trap spectroscopy

Date

2016
Journal article
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dc.contributor.authorMadia, Oreste
dc.contributor.authorAfanasiev, Valeri
dc.contributor.authorCott, Daire
dc.contributor.authorArimura, Hiroaki
dc.contributor.authorSchulte-Braucks, C.
dc.contributor.authorLin, Dennis
dc.contributor.authorBuca, D.
dc.contributor.authorVon Den Driesch, N.
dc.contributor.authorNyns, Laura
dc.contributor.authorIvanov, Tsvetan
dc.contributor.authorCuypers, Dieter
dc.contributor.authorStesmans, Andre
dc.contributor.imecauthorMadia, Oreste
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.imecauthorCott, Daire
dc.contributor.imecauthorArimura, Hiroaki
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorNyns, Laura
dc.contributor.imecauthorIvanov, Tsvetan
dc.contributor.imecauthorCuypers, Dieter
dc.contributor.imecauthorStesmans, Andre
dc.contributor.orcidimecNyns, Laura::0000-0001-8220-870X
dc.contributor.orcidimecIvanov, Tsvetan::0000-0003-3407-2742
dc.contributor.orcidimecCuypers, Dieter::0000-0003-0550-6273
dc.date.accessioned2021-10-23T12:23:22Z
dc.date.available2021-10-23T12:23:22Z
dc.date.embargo9999-12-31
dc.date.issued2016
dc.identifier.issn2162-8769
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26937
dc.identifier.urlhttp://jss.ecsdl.org/content/5/4/P3031.abstract
dc.source.beginpageP3031
dc.source.endpageP3036
dc.source.issue4
dc.source.journalECS Journal of Solid State Science and Technology
dc.source.volume5
dc.title

Saturation Photo-Voltage methodology for semiconductor insulator interface trap spectroscopy

dc.typeJournal article
dspace.entity.typePublication
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