Publication:

Saturation Photo-Voltage methodology for semiconductor insulator interface trap spectroscopy

Date

2016
Journal article
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0001-8220-870X
cris.virtual.orcid0000-0003-0550-6273
cris.virtual.orcid0000-0002-3138-708X
cris.virtual.orcid0000-0002-1577-6050
cris.virtual.orcid0009-0000-0890-8820
cris.virtual.orcid#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0001-5018-4539
cris.virtual.orcid0000-0003-3407-2742
cris.virtualsource.departmentd72479b7-7cd4-4962-a047-ea191c21ef25
cris.virtualsource.department97013840-4a92-4f62-9440-b4729dd38e27
cris.virtualsource.department1f080161-3216-4c75-86ed-d343316d8b4f
cris.virtualsource.departmentb2592186-7449-4534-aafc-90d91a0beb8a
cris.virtualsource.department8f2eba94-8478-45df-9820-022166ffc6fa
cris.virtualsource.department65e35b50-3856-474e-99bc-3b8dc48e80a7
cris.virtualsource.department91643e2e-a544-47ba-88b1-9262d5c6a397
cris.virtualsource.department81d20142-643b-4ea2-8f89-390fd699ef91
cris.virtualsource.department70ac7f56-1f12-4c30-bf36-971557e3129d
cris.virtualsource.orcidd72479b7-7cd4-4962-a047-ea191c21ef25
cris.virtualsource.orcid97013840-4a92-4f62-9440-b4729dd38e27
cris.virtualsource.orcid1f080161-3216-4c75-86ed-d343316d8b4f
cris.virtualsource.orcidb2592186-7449-4534-aafc-90d91a0beb8a
cris.virtualsource.orcid8f2eba94-8478-45df-9820-022166ffc6fa
cris.virtualsource.orcid65e35b50-3856-474e-99bc-3b8dc48e80a7
cris.virtualsource.orcid91643e2e-a544-47ba-88b1-9262d5c6a397
cris.virtualsource.orcid81d20142-643b-4ea2-8f89-390fd699ef91
cris.virtualsource.orcid70ac7f56-1f12-4c30-bf36-971557e3129d
dc.contributor.authorMadia, Oreste
dc.contributor.authorAfanasiev, Valeri
dc.contributor.authorCott, Daire
dc.contributor.authorArimura, Hiroaki
dc.contributor.authorSchulte-Braucks, C.
dc.contributor.authorLin, Dennis
dc.contributor.authorBuca, D.
dc.contributor.authorVon Den Driesch, N.
dc.contributor.authorNyns, Laura
dc.contributor.authorIvanov, Tsvetan
dc.contributor.authorCuypers, Dieter
dc.contributor.authorStesmans, Andre
dc.contributor.imecauthorMadia, Oreste
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.imecauthorCott, Daire
dc.contributor.imecauthorArimura, Hiroaki
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorNyns, Laura
dc.contributor.imecauthorIvanov, Tsvetan
dc.contributor.imecauthorCuypers, Dieter
dc.contributor.imecauthorStesmans, Andre
dc.contributor.orcidimecNyns, Laura::0000-0001-8220-870X
dc.contributor.orcidimecIvanov, Tsvetan::0000-0003-3407-2742
dc.contributor.orcidimecCuypers, Dieter::0000-0003-0550-6273
dc.date.accessioned2021-10-23T12:23:22Z
dc.date.available2021-10-23T12:23:22Z
dc.date.embargo9999-12-31
dc.date.issued2016
dc.identifier.issn2162-8769
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26937
dc.identifier.urlhttp://jss.ecsdl.org/content/5/4/P3031.abstract
dc.source.beginpageP3031
dc.source.endpageP3036
dc.source.issue4
dc.source.journalECS Journal of Solid State Science and Technology
dc.source.volume5
dc.title

Saturation Photo-Voltage methodology for semiconductor insulator interface trap spectroscopy

dc.typeJournal article
dspace.entity.typePublication
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