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Improved microwave absorption technique for bulk and surface lifetime analysis in processed Si wafers
Publication:
Improved microwave absorption technique for bulk and surface lifetime analysis in processed Si wafers
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Date
1999
Proceedings Paper
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3425.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gaubas, Eugenijus
;
Simoen, Eddy
;
Claeys, Cor
;
Poyai, Amporn
Journal
Abstract
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1944
since deposited on 2021-10-06
Acq. date: 2025-12-11
Citations
Metrics
Views
1944
since deposited on 2021-10-06
Acq. date: 2025-12-11
Citations