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Variability study with CD-SEM metrology for STT-MRAM: Correlation analysis between physical dimensions and electrical property of the memory element
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2004 since deposited on 2021-10-24
Acq. date: 2026-06-02
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Statistics
Views
2004 since deposited on 2021-10-24
Acq. date: 2026-06-02
Citations