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Influence of contact area on oxide-oxide fusion bonding quality between 200mm quartz and silicon wafers
Publication:
Influence of contact area on oxide-oxide fusion bonding quality between 200mm quartz and silicon wafers
Date
2017
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Buja, Federico
;
Humbert, Aurelie
;
Visker, Jakob
;
Peng, Lan
Journal
Abstract
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1922
since deposited on 2021-10-24
Acq. date: 2025-10-25
Citations
Metrics
Views
1922
since deposited on 2021-10-24
Acq. date: 2025-10-25
Citations