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Zero-energy SIMS depth profiling: the role of surface roughness development with XeF2 based etching
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2008 since deposited on 2021-10-19
2last month
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Acq. date: 2025-12-10
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2008 since deposited on 2021-10-19
2last month
1last week
Acq. date: 2025-12-10
Citations