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Reliability assessment and lifetime modelling of p-GaN gate AlGaN/GaN high-electron-mobility transistors
Publication:
Reliability assessment and lifetime modelling of p-GaN gate AlGaN/GaN high-electron-mobility transistors
Date
2020-10
Dissertation
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46861.pdf
9.5 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Stockman, Arno
Journal
Abstract
Description
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2050
since deposited on 2021-10-29
Acq. date: 2025-10-25
Citations
Metrics
Views
2050
since deposited on 2021-10-29
Acq. date: 2025-10-25
Citations