Publication:
Reliability assessment and lifetime modelling of p-GaN gate AlGaN/GaN high-electron-mobility transistors
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2060 since deposited on 2021-10-29
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Acq. date: 2026-03-16
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Statistics
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2060 since deposited on 2021-10-29
1last month
1last week
Acq. date: 2026-03-16
Citations