Publication:
Reliability assessment and lifetime modelling of p-GaN gate AlGaN/GaN high-electron-mobility transistors
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2056 since deposited on 2021-10-29
1last month
Acq. date: 2026-01-08
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Views
2056 since deposited on 2021-10-29
1last month
Acq. date: 2026-01-08
Citations