Publication:
Reliability assessment and lifetime modelling of p-GaN gate AlGaN/GaN high-electron-mobility transistors
Date
| dc.contributor.author | Stockman, Arno | |
| dc.contributor.imecauthor | Stockman, Arno | |
| dc.contributor.thesisadvisor | Bakeroot, Benoit | |
| dc.contributor.thesisadvisor | Doutreloigne, Jan | |
| dc.date.accessioned | 2021-10-29T04:51:59Z | |
| dc.date.available | 2021-10-29T04:51:59Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2020-10 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/36020 | |
| dc.title | Reliability assessment and lifetime modelling of p-GaN gate AlGaN/GaN high-electron-mobility transistors | |
| dc.type | PHD thesis | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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