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Conference contributions
Low frequency noise performance of gate-first and replacement metal gate CMOS technologies
Publication:
Low frequency noise performance of gate-first and replacement metal gate CMOS technologies
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Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, Cor
;
Lee, Jae Woo
;
Simoen, Eddy
;
Veloso, Anabela
;
Horiguchi, Naoto
;
Paraschiv, Vasile
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1955
since deposited on 2021-10-21
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last month
2
last week
Acq. date: 2025-12-12
Citations
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Views
1955
since deposited on 2021-10-21
3
last month
2
last week
Acq. date: 2025-12-12
Citations