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Articles
Stability evaluation of Au-free ohmic contacts on AlGaN/GaN HEMTs under a constant current stress
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Stability evaluation of Au-free ohmic contacts on AlGaN/GaN HEMTs under a constant current stress
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Tian-Li
;
Marcon, Denis
;
Stoffels, Steve
;
You, Shuzhen
;
De Jaeger, Brice
;
Van Hove, Marleen
;
Groeseneken, Guido
;
Decoutere, Stefaan
Journal
Microelectronics Reliability
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Views
1769
since deposited on 2021-10-22
2
last month
Acq. date: 2025-12-15
Citations