Publication:

Stability evaluation of Au-free ohmic contacts on AlGaN/GaN HEMTs under a constant current stress

Date

2014
Journal article
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dc.contributor.authorWu, Tian-Li
dc.contributor.authorMarcon, Denis
dc.contributor.authorStoffels, Steve
dc.contributor.authorYou, Shuzhen
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorVan Hove, Marleen
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDecoutere, Stefaan
dc.contributor.imecauthorMarcon, Denis
dc.contributor.imecauthorStoffels, Steve
dc.contributor.imecauthorYou, Shuzhen
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2021-10-22T08:28:47Z
dc.date.available2021-10-22T08:28:47Z
dc.date.issued2014
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24838
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S0026271414002728
dc.source.beginpage2232
dc.source.endpage2236
dc.source.issue9_10
dc.source.journalMicroelectronics Reliability
dc.source.volume54
dc.title

Stability evaluation of Au-free ohmic contacts on AlGaN/GaN HEMTs under a constant current stress

dc.typeJournal article
dspace.entity.typePublication
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