Publication:

Understanding and modelling the PBTI reliability of thin-film IGZO transistors

Date

2021

Proceedings Paper

https://doi.org/10.1109/iedm19574.2021.9720666

Simple item page Full metadata Statistics

Author(s)

Vaisman Chasin, Adrian

;

;

Triantopoulos, Konstantinos

;

Dekkers, Harold

;

Rassoul, Nouredine

;

Belmonte, Attilio

;

;

Subhechha, Subhali

;

;

van Setten, Michiel

;

;

Delhougne, Romain

;

Afanasiev, Valeri

;

;

Kar, Gouri Sankar

Journal

na

Statistics

1991 since deposited on 2022-07-09

16last month

6last week

Acq. date: 2026-09-16