Publication:

Understanding and modelling the PBTI reliability of thin-film IGZO transistors

Date

2021
Proceedings Paper
https://doi.org/10.1109/IEDM19574.2021.9720666
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dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorFranco, Jacopo
dc.contributor.authorTriantopoulos, Konstantinos
dc.contributor.authorDekkers, Harold
dc.contributor.authorRassoul, Nouredine
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorSmets, Quentin
dc.contributor.authorSubhechha, Subhali
dc.contributor.authorClaes, Dieter
dc.contributor.authorvan Setten, Michiel
dc.contributor.authorMitard, Jerome
dc.contributor.authorDelhougne, Romain
dc.contributor.authorAfanasiev, Valeri
dc.contributor.authorKaczer, Ben
dc.contributor.authorKar, Gouri Sankar
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorTriantopoulos, Konstantinos
dc.contributor.imecauthorDekkers, Harold
dc.contributor.imecauthorRassoul, Nouredine
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorSubhechha, Subhali
dc.contributor.imecauthorClaes, Dieter
dc.contributor.imecauthorvan Setten, Michiel
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecDekkers, Harold::0000-0003-4778-5709
dc.contributor.orcidimecRassoul, Nouredine::0000-0001-9489-3396
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecSubhechha, Subhali::0000-0002-1960-5136
dc.contributor.orcidimecvan Setten, Michiel::0000-0003-0557-5260
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2022-08-25T15:27:02Z
dc.date.available2022-07-09T02:27:22Z
dc.date.available2022-08-25T15:27:02Z
dc.date.issued2021
dc.identifier.doi10.1109/IEDM19574.2021.9720666
dc.identifier.eisbn978-1-6654-2572-8
dc.identifier.issn2380-9248
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40077
dc.publisherIEEE
dc.source.conferenceIEEE International Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 11-16, 2021
dc.source.conferencelocationSan Francisco
dc.source.journalna
dc.source.numberofpages4
dc.title

Understanding and modelling the PBTI reliability of thin-film IGZO transistors

dc.typeProceedings paper
dspace.entity.typePublication
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